Our DFT services integrate testability features into complex IP and SoC designs, including scan chain insertion, built-in self-test (BIST), boundary-scan, and ATPG strategies. We develop comprehensive test plans to improve fault coverage, reduce test time, and support efficient manufacturing and in-field diagnostics. By collaborating closely with RTL, verification, and physical design teams, we ensure test structures are seamlessly integrated without impacting performance or area. This results in high-quality, fully testable silicon that minimizes production risks, simplifies post-silicon validation, and accelerates time-to-market.
DFT (Design-for-Test) Services
